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Verios XHR SEM


 

The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family.

 

It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semi-conductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).

 

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