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Inspect


 

With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI's world-class electron optics and sample throughput technologies.

 

When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models' high-resolution imaging is a must. The intuitive user interface and software, with all functions required to record and store an image accessed directly via a tool bar, is well suited for a multi-user environment while full stage access to accommodate a range of specimen holders adds value and flexibility for a range of uses.

 

The Inspect line of tools includes two scanning electron microscopes , one SEM with tungsten and another SEM with FEG, for use where high-resolution imaging is routine. These cost-effective, flexible, state-of-the-art scanning electron microscopes are built using FEI's advanced technology, making them valuable for industrial manufacturers and researchers working with material characterization and inspection applications. 

 

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